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CAN，光纤耦合，光接口可选 7.响应度： 0.2mA/mW@1064nm 0.45mA/mW@905nm 0.2mA/mW@650nm 北京敏光科技有限公司是一家专注光电探测器的研发,生产,销售于一体的高新技术企业。本公司...
CAN,光接口可选 6.响应度： 0.25mA/mW@1064nm 0.5mA/mW@905nm 0.25mA/mW@650nm 北京敏光科技有限公司是一家专注光电探测器的研发,生产,销售于一体的高新技术企业。本公司的光电探测器广泛应用于光纤光学传感，光纤通信，气体光学...
CAN,光接口可选 6.响应度： 0.20mA/mW@530nm 0.35mA/mW@632nm 0.50mA/mW@900nm 北京敏光科技有限公司是一家专注光电探测器的研发,生产,销售于一体的高新技术企业。本公司的光电探测器广泛...
Fujikura FSM-30R – Now the well-proven and market-leading mass fusion splicing technology of previous Fujikura products is provided in an extremely small and lightweight Mini Mass Fusion Splicer. This compact device brings a new level of productivity and capability to mass fusion splicing. It CAN splice...
CAN only be operate remote via GPIB...
CANning capability allows fast characterization across polarization states.描述与内置线偏振器相比，Agilent 8169A提供极化合成。对四分之一波片和半波片逐一进行调整，以决定性方式创建极化所有可能的状态。偏振器生成消光比高的极化线性状态。8169A内部预定算法使传输路径从波英卡里球上的某种极化状态沿着正交大圆到达另一种...
主要特性与技术指标Polarization scramblingWide wavelength range: 1250 - 1640 nmSmall optical insertion loss variation: ± 0.002 dBManual, auto sCAN and GB-IB control我公司还收售其它各类光谱分析仪、点/可调光源、光功率主机/模块/探头、光衰、插回测试仪/模块、光波长计、误码仪、OTDR、各类光电插件模组、熔接机等等。如...
CAN in less than 0.5secWavelength accuracy: ± 0.3 pmHigh Laser Input power: 10dBm (18dBm - Safe Input level)Advanced built-in measurement applications (Drift, OSNR, Data Logging, FP Laser Characterization)Built-in HeNe laser wavelength standardBenefits:The fast wavelength sCAN allows you to double the speed ...
HP/Agilent 81611A回损模块The Agilent Return Loss Meters are ideal for making measurementson fast telecommunications systems, such as filters, multiplexers, cross-connects,amplifiers and whole systems under test. They CAN also be deployed in bothR&D and production environments and are suitable for singlemo...
详细介绍81534A 回波损耗模块,InGaAs,60 dB/65dB回波损耗范围:1250-1600nm The Agilent Return Loss Meters are ideal for making measurements on fast telecommunications systems, such as filters, multiplexers, cross-connects, amplifiers and whole systems under test. They CAN also be deployed in both R&D and ...
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