Agilent 4155B Semiconductor Parameter Analyzer
The 4155B Semiconductor Parameter Analyzer is a stand-alone instrument capable of complete dc characterization of semiconductor devices and materials. It stimulates voltage and current sensitive devices, measures the resulting current and voltage response, and displays the results in a user-selectable format (graph, list, matrix or schmoo) on a built-in CRT display. Features: High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1V to 200 V Fully-automated I-V sweep measurements with dc or pulse mode, expandable up to 6 SMUs Synchronized stress/measure function, two high-voltage pulse generator units (40 V) Time-domain measurement: 60s variable intervals, up to 10,001 points Easy to use: knob-sweep similar to curve tracer, automatic analysis functions Automation: built-in HP Instrument BASIC, trigger I/O capability Options: 050 = 50Hz line frequency 50Hz line frequency For 50Hz line frequency. 060 = 60Hz line frequency 60Hz line frequency For 60Hz line frequency.
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